A new tool for random testability evaluation using simulation and formal proof

E. Simeu, Anura Puissochet, J. Rainard, Anne-Marie Tagant, M. Poize
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引用次数: 5

Abstract

A set of tools is described, allowing one to compute random testability measurement for combinational circuits, based on a black box worst case hypothesis. These tools provide enough information to allow circuit modification, in order to meet a prescribed testability value. The efficiency of these tools is due to the use of a statistical method combined with formal proof mechanisms. The random testability of the complete ISCAS benchmark of combinational circuits is computed. For the least testable circuits, a few modifications, guided by the testability measurements, are shown to be sufficient to make them randomly testable.<>
一种基于模拟和形式化证明的随机测试性评估新工具
一套工具被描述,允许一个计算随机可测试性测量的组合电路,基于黑盒最坏情况的假设。这些工具提供足够的信息,允许电路修改,以满足规定的可测试性值。这些工具的效率是由于使用了统计方法与正式证明机制相结合。计算了组合电路完整ISCAS基准的随机可测性。对于可测试性最低的电路,在可测试性测量的指导下进行一些修改就足以使其随机可测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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