G. Kreider, J. Bosiers, B. Dillen, J. van der Heijden, W. Hoekstra, A. Kleimann, P. Opmeer, J. Oppers, H. Peek, R. Pellens, A. Theuwissen
{"title":"An mK/spl times/nK modular image sensor design","authors":"G. Kreider, J. Bosiers, B. Dillen, J. van der Heijden, W. Hoekstra, A. Kleimann, P. Opmeer, J. Oppers, H. Peek, R. Pellens, A. Theuwissen","doi":"10.1109/IEDM.1995.497203","DOIUrl":null,"url":null,"abstract":"A 1 K/spl times/2 K full frame sensor demonstrates a new modular sensor design. Each imager in the family is built from smaller, abutable blocks which are exposed in the correct position during lithography. These blocks can be stacked to form sensors of arbitrary size, all based on the same pixel structure. These pixels have a high charge handling capability, vertical anti-blooming, electronic shuttering, a high light sensitivity, and low dark current.","PeriodicalId":137564,"journal":{"name":"Proceedings of International Electron Devices Meeting","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1995.497203","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A 1 K/spl times/2 K full frame sensor demonstrates a new modular sensor design. Each imager in the family is built from smaller, abutable blocks which are exposed in the correct position during lithography. These blocks can be stacked to form sensors of arbitrary size, all based on the same pixel structure. These pixels have a high charge handling capability, vertical anti-blooming, electronic shuttering, a high light sensitivity, and low dark current.