In-system timing extraction and control through scan-based, test-access ports

Abstract

We present circuits and techniques which allow the extraction of fine-grained timing information using a simple, scan-based, test-access port such as the JTAG/IEEE 1149 standard. We go on to show how these techniques can be combined with other simple circuits for post-fabrication timing control. These techniques open up opportunities to perform timing oriented tests through TAP control. Further, they allow in-system timing adaptation which can be exploited to achieve high system performance.