The role of elastic and plastic anisotropy of Sn on microstructure and damage evolution in lead-free solder joints

T. Bieler, Bite Zhou, L. Blair, A. Zamiri, P. Darbandi, F. Pourboghrat, Tae-Kyu Lee, K. Liu
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引用次数: 9

Abstract

The elastic, thermal expansion, and plastic anisotropy of Sn is examined to assess how anisotropy affects the microstructural evolution and damage nucleation processes in SAC305 solder joints. Examination of all joints in a package indicates that upon solidification, crystal orientations are nearly randomly distributed. Initial studies of cracked joints after thermal cycling showed that orientations with the c-axis parallel to the joint interface (red orientations) are more likely to crack arising from tensile stresses during the hot part of the cycle. Subsequent studies show that package design has a large influence on how the microstructure evolves; higher strain designs stimulate recrystallization at earlier times. Recrystallization appears to be strongly correlated with crack nucleation and propagation processes, as red orientations often develop and lead to crack nucleation and propagation. The details of the recrystallization process depend strongly on the plastic slip and recovery processes arising from the specific crystal orientation / temperature / strain history that makes microstructural evolution of each joint unique. The unique history for each joint implies that worst case scenarios need to be identified and models developed that can predict microstructural evolution that leads to worst case scenarios.
锡的弹塑性各向异性对无铅焊点组织和损伤演变的影响
研究了锡的弹性、热膨胀和塑性各向异性,以评估各向异性如何影响SAC305焊点的显微组织演变和损伤成核过程。对包装中所有接头的检查表明,在凝固时,晶体取向几乎是随机分布的。热循环后裂纹节理的初步研究表明,c轴平行于节理界面的方向(红色方向)在热循环阶段更容易因拉伸应力而产生裂纹。随后的研究表明,封装设计对微结构的演变有很大的影响;高应变设计在较早的时间刺激再结晶。再结晶与裂纹的形核和扩展过程密切相关,因为红色取向经常形成并导致裂纹的形核和扩展。再结晶过程的细节在很大程度上取决于由特定晶体取向/温度/应变历史引起的塑性滑移和恢复过程,这使得每个接头的微观结构演变都是独一无二的。每个关节的独特历史意味着需要确定最坏的情况,并开发可以预测导致最坏情况的微观结构演变的模型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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