Bumping wafers via ultrasonically enhanced stencil printing

F. Andres, C. Lee, G. Pham-Van-diep
{"title":"Bumping wafers via ultrasonically enhanced stencil printing","authors":"F. Andres, C. Lee, G. Pham-Van-diep","doi":"10.1109/IEMT.2003.1225923","DOIUrl":null,"url":null,"abstract":"Traditional solder paste stencil printing is widely used and a well understood process in surface mount board assembly. But when applied to solder bumping wafers, stencil printing faces several challenges such as meeting bump height, co-planarity and voiding requirements. There are physical limitations within stencil printing that limits solder paste deposits at extremely tight pitches. Recent work has demonstrated that stencil printing can produce greater and more reliable material transfers at tighter pitches when high frequency vibrations are applied to the stencil at the time of stencil/substrate separation. This paper examines the feasibility of using conventional stencil printing coupled with an innovative ultrasonically enhanced procedure to offer a cost effective, flexible technique for solder wafer bumping. The effects of applying a high frequency vibration to a variety of stencil designs will be examined for wafer bumping applications. Paste development, reflow and process optimization will be discussed. Work will focus on bumping wafers with 250 /spl mu/m pitch and 100 /spl mu/m bump height. Bump height distribution, co-planarity performance and die yield per wafer are examined to determine the viability of the technique.","PeriodicalId":106415,"journal":{"name":"IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003.","volume":"107 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2003.1225923","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Traditional solder paste stencil printing is widely used and a well understood process in surface mount board assembly. But when applied to solder bumping wafers, stencil printing faces several challenges such as meeting bump height, co-planarity and voiding requirements. There are physical limitations within stencil printing that limits solder paste deposits at extremely tight pitches. Recent work has demonstrated that stencil printing can produce greater and more reliable material transfers at tighter pitches when high frequency vibrations are applied to the stencil at the time of stencil/substrate separation. This paper examines the feasibility of using conventional stencil printing coupled with an innovative ultrasonically enhanced procedure to offer a cost effective, flexible technique for solder wafer bumping. The effects of applying a high frequency vibration to a variety of stencil designs will be examined for wafer bumping applications. Paste development, reflow and process optimization will be discussed. Work will focus on bumping wafers with 250 /spl mu/m pitch and 100 /spl mu/m bump height. Bump height distribution, co-planarity performance and die yield per wafer are examined to determine the viability of the technique.
通过超声增强的模板印刷来碰撞晶圆片
传统的锡膏模板印刷在表面贴装板组装中被广泛使用,并且是一个很好的理解过程。但当应用于焊接凸点晶圆时,模板打印面临着诸如满足凸点高度、共面性和空隙性要求等几个挑战。在模板印刷中存在物理限制,限制了锡膏沉积在极紧的螺距处。最近的研究表明,当在模板/基板分离时,在模板上施加高频振动时,模板印刷可以在更紧的螺距上产生更大、更可靠的材料转移。本文探讨了使用传统的模板印刷与创新的超声增强程序相结合的可行性,为焊料晶圆碰撞提供了一种具有成本效益的灵活技术。应用高频振动对各种模板设计的影响将被用于晶圆碰撞应用。膏体开发,回流和工艺优化将讨论。工作将集中在250 /spl亩/米间距和100 /spl亩/米碰撞高度的晶圆上。研究了凸点高度分布、共平面性能和每片晶圆的成品率,以确定该技术的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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