{"title":"The impact of functional safety standards in the design and test of reliable and available integrated circuits","authors":"R. Mariani","doi":"10.1109/ETS.2012.6233048","DOIUrl":null,"url":null,"abstract":"The panel gives an overview of requirements, problems and solutions related to the application of ISO 26262 (the international norm ruling functional safety for automotive) and IEC 61508 2nd edition (the international norm widely used in industrial domain) to the design and test of integrated circuits.","PeriodicalId":429839,"journal":{"name":"2012 17th IEEE European Test Symposium (ETS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 17th IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2012.6233048","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
The panel gives an overview of requirements, problems and solutions related to the application of ISO 26262 (the international norm ruling functional safety for automotive) and IEC 61508 2nd edition (the international norm widely used in industrial domain) to the design and test of integrated circuits.