An Enhanced SRAM BISR Design with Reduced Timing Penalty

Li-Ming Denq, Tzu-Chiang Wang, Cheng-Wen Wu
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引用次数: 13

Abstract

Redundancy repair is an effective yield-enhancement technique for memories. There are many previously proposed repair methodologies, such as the popular repair methodology based on the concept of address remapping mechanism achieved by address comparison and address reconfiguration. However, a BISR design with a typical address remapping mechanism usually involves significant timing penalty. Therefore, we propose a new address remapping scheme with a write buffer to reduce the timing penalty. Our experiments show that with the proposed address remapping scheme and redundancy architecture, the timing penalty of our BISR scheme is the same with that of the built-in self-test (BIST) circuit-only one multiplexer delay for both the inputs and outputs
一种减少时间损失的增强型SRAM BISR设计
冗余修复是一种有效的存储器增产技术。以前提出的修复方法有很多,如流行的基于地址重映射机制的修复方法,通过地址比较和地址重新配置来实现。然而,具有典型地址重映射机制的BISR设计通常涉及明显的时间损失。因此,我们提出了一种带有写缓冲区的新地址重映射方案,以减少时间损失。我们的实验表明,使用所提出的地址重映射方案和冗余架构,我们的BISR方案的时间损失与内置自检(BIST)电路相同-输入和输出都只有一个多路复用器延迟
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