Backside ultraviolet illumination enhanced metal-assisted chemical etching for high-aspect-ratio silicon microstructures

D. Shi, Yun Chen, Yanhui Chen, Maoxiang Hou, Xun Chen, Xin Chen, Jian Gao, Yunbo He
{"title":"Backside ultraviolet illumination enhanced metal-assisted chemical etching for high-aspect-ratio silicon microstructures","authors":"D. Shi, Yun Chen, Yanhui Chen, Maoxiang Hou, Xun Chen, Xin Chen, Jian Gao, Yunbo He","doi":"10.1109/ICEPT50128.2020.9202685","DOIUrl":null,"url":null,"abstract":"High-aspect-ratio silicon microstructures have been widely used in micro-electro-mechanical systems, microelectronics cooling and electronic packaging. Recently, metal-assisted chemical etching (MACE) was proved to be an effective alternative to achieve various microstructures. In traditional MACE, holes are generated by the metal catalyst induced reduction of the etchant. However, when the aspect ratio of the fabricated microstructure increases, the mobility of the reactants and the resultant are correspondingly impeded, resulting in insufficient holes, thus, the etching rate decreases significantly. In this study, back-side ultraviolet (UV) illumination in MACE was proposed to provide additional holes. A novel experimental setup was designed and developed. Compared with the traditional MACE, the back-side UV illumination enhanced MACE can significantly enhance the etching rate and fabricate root-like Si microstructures. It is revealed that the holes which are generated by the back-side UV illuminating area can diffuse through bulk Si, accumulate in the etchant side because of the trapping of the pore tip, and participate in the etching reaction. By tuning the applied UV power, root-like microstructures with its width varying from 4.9 to 63.8 μm and depth varying from 13.7 to 47.4 μm were achieved. This study can provide useful insights for developing novel Si processing techniques and fabricating various microstructures.","PeriodicalId":136777,"journal":{"name":"2020 21st International Conference on Electronic Packaging Technology (ICEPT)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 21st International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT50128.2020.9202685","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

High-aspect-ratio silicon microstructures have been widely used in micro-electro-mechanical systems, microelectronics cooling and electronic packaging. Recently, metal-assisted chemical etching (MACE) was proved to be an effective alternative to achieve various microstructures. In traditional MACE, holes are generated by the metal catalyst induced reduction of the etchant. However, when the aspect ratio of the fabricated microstructure increases, the mobility of the reactants and the resultant are correspondingly impeded, resulting in insufficient holes, thus, the etching rate decreases significantly. In this study, back-side ultraviolet (UV) illumination in MACE was proposed to provide additional holes. A novel experimental setup was designed and developed. Compared with the traditional MACE, the back-side UV illumination enhanced MACE can significantly enhance the etching rate and fabricate root-like Si microstructures. It is revealed that the holes which are generated by the back-side UV illuminating area can diffuse through bulk Si, accumulate in the etchant side because of the trapping of the pore tip, and participate in the etching reaction. By tuning the applied UV power, root-like microstructures with its width varying from 4.9 to 63.8 μm and depth varying from 13.7 to 47.4 μm were achieved. This study can provide useful insights for developing novel Si processing techniques and fabricating various microstructures.
背面紫外光照射增强金属辅助化学蚀刻高纵横比硅微结构
高纵横比硅微结构已广泛应用于微机电系统、微电子冷却和电子封装等领域。近年来,金属辅助化学蚀刻(MACE)被证明是实现各种微结构的有效替代方法。在传统的MACE中,孔洞是由金属催化剂诱导蚀刻剂还原而产生的。然而,当制备的微结构长径比增大时,相应阻碍了反应物和产物的迁移,导致孔洞不足,从而使蚀刻速率显著降低。在这项研究中,我们提出在MACE中使用背面紫外线照明来提供额外的孔洞。设计并研制了一种新型实验装置。与传统的MACE相比,背面UV光照增强的MACE可以显著提高蚀刻速率并制备出根状Si微结构。结果表明,背面紫外光照射区产生的孔洞可以通过体硅扩散,并由于孔尖的捕获而在蚀刻侧聚集,参与蚀刻反应。通过调节施加的紫外功率,获得了宽度为4.9 ~ 63.8 μm、深度为13.7 ~ 47.4 μm的根状微结构。该研究可为开发新型硅加工技术和制造各种微结构提供有用的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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