Zhibin Han, Jianxin Liu, Gary Chaw, Shengdong Zhang
{"title":"The Analysis of Vertical Cross Talk on Top Emission AMOLED","authors":"Zhibin Han, Jianxin Liu, Gary Chaw, Shengdong Zhang","doi":"10.1109/ICEPT50128.2020.9201921","DOIUrl":null,"url":null,"abstract":"In Top Emission AMOLED pixel, data line will overlap with anode layer, resulting in large parasitic capacitance Cpd (Capacitance between dateline and pixel anode). Therefore, we conduct electrical simulation analysis on cross-talk caused by dataline. Unlike LCD, The parasitic capacitance did not cause obvious cross-talk, while vertical cross-talk was mainly caused by the leakage of TFT, and the effect of TFT leakage could be improved by adjusting pixel storage capacitance.","PeriodicalId":136777,"journal":{"name":"2020 21st International Conference on Electronic Packaging Technology (ICEPT)","volume":"606 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 21st International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT50128.2020.9201921","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In Top Emission AMOLED pixel, data line will overlap with anode layer, resulting in large parasitic capacitance Cpd (Capacitance between dateline and pixel anode). Therefore, we conduct electrical simulation analysis on cross-talk caused by dataline. Unlike LCD, The parasitic capacitance did not cause obvious cross-talk, while vertical cross-talk was mainly caused by the leakage of TFT, and the effect of TFT leakage could be improved by adjusting pixel storage capacitance.