Improved QFN thermal cycling reliability using low melting temperature SnBi based solder paste LMPA-Q

B. Vandevelde, R. Labie, R. Lauwaert, Daniel Werkhoven, D. Vanderstraeten, E. Blansaer, Jonas Lannoo, D. Pissoort
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引用次数: 4

Abstract

In this work, the solder joint reliability of QFN components is experimentally tested in thermal cycling and four-point bending cycling conditions, and this for three different solder materials: standard SAC305, low Ag SAC alloy and a new low melting temperature SnBi based alloy LMPA-Q. The outcome of the study is to evaluate if these new SnBi based solder material perform similar, worse or better than the more standard lead-free solders.
采用低熔点SnBi基锡膏LMPA-Q提高QFN热循环可靠性
在本工作中,对QFN组件的焊点可靠性进行了热循环和四点弯曲循环条件下的实验测试,并对三种不同的焊料材料:标准SAC305,低Ag SAC合金和新型低熔点SnBi基合金LMPA-Q进行了测试。研究的结果是评估这些新的SnBi基焊料材料的性能是否与更标准的无铅焊料相似,更差或更好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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