The impact of moisture in mold compound preforms on the warpage of PBGA packages

T. Lin, B. Njoman, D. Crouthamel, K. H. Chua, S. Y. Teo, Y. Y. Ma
{"title":"The impact of moisture in mold compound preforms on the warpage of PBGA packages","authors":"T. Lin, B. Njoman, D. Crouthamel, K. H. Chua, S. Y. Teo, Y. Y. Ma","doi":"10.1109/IEMT.2003.1225913","DOIUrl":null,"url":null,"abstract":"The moisture in the mold compound preforms influenced the resultant mechanical properties as well as the warpage of IC packages after molding and post mold curing (PMC) process. The moisture will diffuse into the mold compound preforms (compound pallet) after thawing from cold room and exposing to the clean room condition before molding process. The moisture will swell the package and combine with thermal stress, and finally result in the warpage of molded package after molding process. The main objective of this paper is to address the impact of moisture in the compound preforms on the warpage of the PBGA packages and explain the resultant mechanical properties changes under the different moisture conditions, e.g., the variations of the flexural modulus, Tg, and CTE with respect to the moisture level. The actual compound preforms exposure to a clean room condition, were simulated by a series of experiments. The warpage of PBGA packages were measured in terms of moire test. The moisture control during the IC manufacturing process was highlighted in terms of the mechanical properties variation and warpage measurement due to the moisture effects on the mold compound performs.","PeriodicalId":106415,"journal":{"name":"IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003.","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2003.1225913","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 32

Abstract

The moisture in the mold compound preforms influenced the resultant mechanical properties as well as the warpage of IC packages after molding and post mold curing (PMC) process. The moisture will diffuse into the mold compound preforms (compound pallet) after thawing from cold room and exposing to the clean room condition before molding process. The moisture will swell the package and combine with thermal stress, and finally result in the warpage of molded package after molding process. The main objective of this paper is to address the impact of moisture in the compound preforms on the warpage of the PBGA packages and explain the resultant mechanical properties changes under the different moisture conditions, e.g., the variations of the flexural modulus, Tg, and CTE with respect to the moisture level. The actual compound preforms exposure to a clean room condition, were simulated by a series of experiments. The warpage of PBGA packages were measured in terms of moire test. The moisture control during the IC manufacturing process was highlighted in terms of the mechanical properties variation and warpage measurement due to the moisture effects on the mold compound performs.
研究了结晶器预成型中水分对PBGA封装翘曲的影响
模具复合预制件中的水分影响了IC封装成型和模后固化(PMC)过程后的机械性能和翘曲度。在成型前,从冷藏室解冻并暴露在洁净室条件下后,水分会扩散到模具复合预制品(复合托盘)中。水分会使包装膨胀并与热应力结合,最终导致成型后的成型包装翘曲。本文的主要目的是解决复合预成型中水分对PBGA封装翘曲的影响,并解释在不同水分条件下产生的机械性能变化,例如,弯曲模量、Tg和CTE随水分水平的变化。通过一系列的实验模拟了实际的复合预制体在洁净室条件下的暴露。采用云纹试验测量PBGA封装的翘曲度。在集成电路制造过程中,由于水分对模具复合性能的影响,在机械性能变化和翘曲测量方面强调了水分控制。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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