A high-resolution all-digital phase-locked loop with its application to built-in speed grading for memory

H. Hsu, Chun-Chieh Tu, Shi-Yu Huang
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引用次数: 18

Abstract

In this paper we present a high-resolution and wide-range all-digital phase-locked loop (ADPLL), which is suitable to function as a clock generator. The digitally controlled oscillator (DCO) is able to operate from 70 to 725 MHz and achieves 5.2ps resolution. The phase-frequency detector (PFD) is designed using a latch-based sense amplifier, leading to a nearly perfect PFD that is able to resolve a phase difference as minute as only 1ps. In addition, we use this ADPLL as a vehicle to perform built-in speed grading (BISG) for memory. Combining a binary search process with multiple runs of built-in self-test (BIST), the maximum operating speed can thus be tracked down on the chip with a high precision.
高分辨率全数字锁相环及其应用于内存内置速度分级
本文设计了一种高分辨率、宽量程的全数字锁相环(ADPLL),适合作为时钟发生器。数字控制振荡器(DCO)能够在70至725 MHz范围内工作,并实现5.2ps分辨率。相位频率检测器(PFD)采用基于锁存器的感测放大器设计,使得PFD几乎完美,能够分辨小至1ps的相位差。此外,我们使用该ADPLL作为执行内存内置速度分级(BISG)的载体。将二进制搜索过程与多次运行的内置自检(BIST)相结合,可以高精度地在芯片上跟踪最大运行速度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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