{"title":"Full symbolic ATPG for large circuits","authors":"G. Cabodi, P. Camurati, S. Quer","doi":"10.1109/TEST.1994.528047","DOIUrl":null,"url":null,"abstract":"Until now, symbolic FSM state space exploration techniques were limited to small circuits. This paper presents a combination of approximate forward and exact backward traversal that handles larger circuits. For the first time, we have been able to generate test patterns for or to tag as undetectable the faults of some ISCAS'89 and MCNC benchmarks never considered before.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.528047","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
Until now, symbolic FSM state space exploration techniques were limited to small circuits. This paper presents a combination of approximate forward and exact backward traversal that handles larger circuits. For the first time, we have been able to generate test patterns for or to tag as undetectable the faults of some ISCAS'89 and MCNC benchmarks never considered before.