Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits

Abstract

While a number of methods exist for asynchronous circuit synthesis, there are limited applicable test methodologies. This paper presents a Built-In Self-Test (BIST) method for Multi-Threshold NULL Convention Logic (MTNCL) asynchronous circuits, which utilizes standard synchronous tools, and is automated to achieve maximum fault coverage while minimizing area overhead and test time.