Compton Scattering Pinhole Imaging Technology for Measuring and Diagnosing Dose Field Intensity Distribution of Intense Pulse Gamma Ray Beams

Abstract

In the intense pulsed gamma radiation environment (dose rate>1GGy (SI)/s, FWHM10-20ns), the damage of electronic devices and systems exhibits a strong dose rate effect. The dose field distribution of the intense pulse gamma-ray beam generated by the “Qiang guang 1” accelerator is an urgent problem to be solved. It is the premise of carrying out the experiment of high dose rate effect to obtain the distribution information of strong dose field accurately and quickly. In this paper, we present a method for the problem based on the Compton scattering method: placing a target near the exit and using a pinhole imaging system, the scattered gamma intensity distribution at the thin target is reconstructed, and then the intensity distribution of the dose field of the strong pulsed gamma ray beam at the thin target is given.