{"title":"Current overshoot during set and reset operations of resistive switching memories","authors":"An Chen","doi":"10.1109/IRPS.2012.6241919","DOIUrl":null,"url":null,"abstract":"Low switching current is required for low-power operation of resistive switching memories. Current overshoot during set switching is caused by parasitic capacitance, which may be minimized by effective switching control and reduction of parasitic effects. A different form of current overshoot is also observed during reset switching, where devices go through a transient resistance-reduction process before the reset switching occurs. Reset current overshoot increases actual reset power. Current overshoot has significant impact on the reliability and switching power of resistive switching memories.","PeriodicalId":341663,"journal":{"name":"2012 IEEE International Reliability Physics Symposium (IRPS)","volume":"355 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2012.6241919","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
Low switching current is required for low-power operation of resistive switching memories. Current overshoot during set switching is caused by parasitic capacitance, which may be minimized by effective switching control and reduction of parasitic effects. A different form of current overshoot is also observed during reset switching, where devices go through a transient resistance-reduction process before the reset switching occurs. Reset current overshoot increases actual reset power. Current overshoot has significant impact on the reliability and switching power of resistive switching memories.