{"title":"An I/sub DDQ/ based built-in concurrent test technique for interconnects in a boundary scan environment","authors":"C. Su, Kychin Hwang, S. Jou","doi":"10.1109/TEST.1994.528012","DOIUrl":null,"url":null,"abstract":"An I/sub DDQ/ based scheme has been presented for concurrent built-in self-test of MCM interconnects. The scheme detects interconnect faults while the system is on-line.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.528012","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
An I/sub DDQ/ based scheme has been presented for concurrent built-in self-test of MCM interconnects. The scheme detects interconnect faults while the system is on-line.
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