{"title":"Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies","authors":"Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, A. Kuwana, K. Hatayama, Haruo Kobayashi","doi":"10.1109/ITC50571.2021.00038","DOIUrl":null,"url":null,"abstract":"This paper describes that the mature ADC testing method with a simple test system using the incoherent sampling and the standard algorithm of windowing and FFT with 4Kpoint data can measure the SINAD of our target 12-bit SAR ADC accurately by proper setting of the input and sampling frequencies, which is industry-friendly. We show the input sinusoidal signal and sampling clock frequency relationship for accurate testing of the ADC dynamic characteristics with an incoherent sampling method using a flat-top window. We have clarified the measured SINAD accuracy of the input signal frequency dependency for a fixed sampling frequency, a specified resolution of the ADC under test and a given number of FFT points (data samples) in the incoherent sampling environment. Mature technology combinations with their optimal usage and without advanced methods can lead to the low-cost high-quality testing of the ADC, which can be well accepted in industry. Their analysis, simulation and experimental results are shown.","PeriodicalId":147006,"journal":{"name":"2021 IEEE International Test Conference (ITC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITC50571.2021.00038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper describes that the mature ADC testing method with a simple test system using the incoherent sampling and the standard algorithm of windowing and FFT with 4Kpoint data can measure the SINAD of our target 12-bit SAR ADC accurately by proper setting of the input and sampling frequencies, which is industry-friendly. We show the input sinusoidal signal and sampling clock frequency relationship for accurate testing of the ADC dynamic characteristics with an incoherent sampling method using a flat-top window. We have clarified the measured SINAD accuracy of the input signal frequency dependency for a fixed sampling frequency, a specified resolution of the ADC under test and a given number of FFT points (data samples) in the incoherent sampling environment. Mature technology combinations with their optimal usage and without advanced methods can lead to the low-cost high-quality testing of the ADC, which can be well accepted in industry. Their analysis, simulation and experimental results are shown.