Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies

Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, A. Kuwana, K. Hatayama, Haruo Kobayashi
{"title":"Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies","authors":"Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, A. Kuwana, K. Hatayama, Haruo Kobayashi","doi":"10.1109/ITC50571.2021.00038","DOIUrl":null,"url":null,"abstract":"This paper describes that the mature ADC testing method with a simple test system using the incoherent sampling and the standard algorithm of windowing and FFT with 4Kpoint data can measure the SINAD of our target 12-bit SAR ADC accurately by proper setting of the input and sampling frequencies, which is industry-friendly. We show the input sinusoidal signal and sampling clock frequency relationship for accurate testing of the ADC dynamic characteristics with an incoherent sampling method using a flat-top window. We have clarified the measured SINAD accuracy of the input signal frequency dependency for a fixed sampling frequency, a specified resolution of the ADC under test and a given number of FFT points (data samples) in the incoherent sampling environment. Mature technology combinations with their optimal usage and without advanced methods can lead to the low-cost high-quality testing of the ADC, which can be well accepted in industry. Their analysis, simulation and experimental results are shown.","PeriodicalId":147006,"journal":{"name":"2021 IEEE International Test Conference (ITC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITC50571.2021.00038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper describes that the mature ADC testing method with a simple test system using the incoherent sampling and the standard algorithm of windowing and FFT with 4Kpoint data can measure the SINAD of our target 12-bit SAR ADC accurately by proper setting of the input and sampling frequencies, which is industry-friendly. We show the input sinusoidal signal and sampling clock frequency relationship for accurate testing of the ADC dynamic characteristics with an incoherent sampling method using a flat-top window. We have clarified the measured SINAD accuracy of the input signal frequency dependency for a fixed sampling frequency, a specified resolution of the ADC under test and a given number of FFT points (data samples) in the incoherent sampling environment. Mature technology combinations with their optimal usage and without advanced methods can lead to the low-cost high-quality testing of the ADC, which can be well accepted in industry. Their analysis, simulation and experimental results are shown.
用适当的正弦信号和采样频率进行非相干采样的精确ADC测试
本文介绍了成熟的ADC测试方法,通过一个简单的测试系统,采用非相干采样和标准的4 k点数据加窗和FFT算法,通过适当设置输入频率和采样频率,可以准确地测量我们的目标12位SAR ADC的SINAD,具有工业友好性。我们展示了输入正弦信号和采样时钟频率的关系,以便使用平顶窗的非相干采样方法精确测试ADC的动态特性。我们已经澄清了在非相干采样环境中,对于固定采样频率、被测ADC的指定分辨率和给定数量的FFT点(数据样本),输入信号频率依赖的测量SINAD精度。成熟的技术组合和它们的最佳使用,不需要先进的方法,可以实现低成本的高质量的ADC测试,这在工业上是可以接受的。给出了分析、仿真和实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信