BIST-assisted power aware self healing RF circuits

Abstract

In this paper, a novel methodology for post manufacture tuning of RF circuits is presented. The procedure uses an iterative test-tune-test algorithm that applies a compact alternative test to the DUT and modulates circuit level tuning knobs (bias/supply values) based on the DUT specification values predicted from the test. The test procedure is repeated until convergence to the desired spec values is achieved with minimal impact on circuit power consumption. A key benefit of this approach is that tuning of multiple specifications can be performed concurrently due to the use of the alternative test methodology allowing upto 10X savings in test/tuning time.