{"title":"A new technique for totally self-checking CMOS circuit design for stuck-on and stuck-off faults","authors":"M. S. Cheema, P. Lala","doi":"10.1109/VTEST.1992.232741","DOIUrl":null,"url":null,"abstract":"Presents a new technique for designing single stage fully complementary metal oxide semiconductor (FCMOS) and CMOS domino logic circuits so that they are totally self checking for all single s-off and s-on faults. It involves the encoding of the output of the circuit in an error detecting code. CMOS circuits designed using the technique have two outputs. Two of the combinations (01,10) are considered to be valid code-words. The circuit is augmented such that any stuck-off (stuck-on) fault in the modified circuit produces a non-valid output 11(00), thus ensuring automatic fault detection.<<ETX>>","PeriodicalId":434977,"journal":{"name":"Digest of Papers. 1992 IEEE VLSI Test Symposium","volume":"24 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers. 1992 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1992.232741","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Presents a new technique for designing single stage fully complementary metal oxide semiconductor (FCMOS) and CMOS domino logic circuits so that they are totally self checking for all single s-off and s-on faults. It involves the encoding of the output of the circuit in an error detecting code. CMOS circuits designed using the technique have two outputs. Two of the combinations (01,10) are considered to be valid code-words. The circuit is augmented such that any stuck-off (stuck-on) fault in the modified circuit produces a non-valid output 11(00), thus ensuring automatic fault detection.<>