LUT-based Circuit Approximation with Targeted Error Guarantees

U. VinodG., S. VineeshV., Jaynarayan T. Tudu, M. Fujita, Virendra Singh
{"title":"LUT-based Circuit Approximation with Targeted Error Guarantees","authors":"U. VinodG., S. VineeshV., Jaynarayan T. Tudu, M. Fujita, Virendra Singh","doi":"10.1109/ATS49688.2020.9301574","DOIUrl":null,"url":null,"abstract":"Approximate circuits are widely gaining popularity in various fields where error tolerance is applicable. However, striking the right balance between error tolerance and the output quality is a challenging step in the overall design of approximate systems. We propose a systematic approach utilizing Look-Up Table (LUT)-based netlist transformations to achieve approximation while targeting specific error guarantees. Specifically, we employ a SAT-based property checking technique to accommodate worst-case error constraints acting as error guarantees. The proposed methodology involves the formulation of templates to enable the reusability of the technique for different design choices. The analysis comprises of fitness function evaluation based on layout area or the considered error guarantees. We analyze the impact of different parameters on the quality of the output of the resulting approximation and the time taken to obtain them.","PeriodicalId":220508,"journal":{"name":"2020 IEEE 29th Asian Test Symposium (ATS)","volume":"175 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 29th Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS49688.2020.9301574","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

Approximate circuits are widely gaining popularity in various fields where error tolerance is applicable. However, striking the right balance between error tolerance and the output quality is a challenging step in the overall design of approximate systems. We propose a systematic approach utilizing Look-Up Table (LUT)-based netlist transformations to achieve approximation while targeting specific error guarantees. Specifically, we employ a SAT-based property checking technique to accommodate worst-case error constraints acting as error guarantees. The proposed methodology involves the formulation of templates to enable the reusability of the technique for different design choices. The analysis comprises of fitness function evaluation based on layout area or the considered error guarantees. We analyze the impact of different parameters on the quality of the output of the resulting approximation and the time taken to obtain them.
具有目标误差保证的基于lut的电路逼近
近似电路在各种需要容错的领域得到了广泛的应用。然而,在误差容忍度和输出质量之间取得适当的平衡是近似系统总体设计中一个具有挑战性的步骤。我们提出了一种系统的方法,利用基于查找表(LUT)的网表转换来实现近似,同时针对特定的错误保证。具体来说,我们采用了基于sat的属性检查技术,以适应作为错误保证的最坏情况错误约束。所提出的方法涉及到模板的制定,以实现该技术对不同设计选择的可重用性。分析包括基于布局面积的适应度函数评估或考虑误差保证。我们分析了不同参数对结果逼近输出质量的影响以及获得它们所花费的时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信