Bulk resistance decay in CdTe

A. Andreev, L. Grmela, J. Sikula, M. Chvatal, M. Raska
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Abstract

Bulk resistance decay of cadmium telluride (CdTe) single crystals was investigated. The bulk resistance of each CdTe single crystal was measured during long time interval. The samples were placed into a cryostat. That allowed us to hold the temperature constant during the measurements and eliminate the illumination influence. The measurements started and were continued at 300 K and after some period of time it was sharply raised up to 390 K. We observed the resistance slow decreasing with time with temperature T = 300 K and T = 390 K. All the samples have very high value of relaxation time. The presented samples must have not one but four acceptor or donor levels, some of them are deep levels. We have discovered that the interactions between the valence band and deep acceptor levels or between the conductivity band and deep donor levels cause this long value of relaxation time.
CdTe的体电阻衰减
研究了碲化镉(CdTe)单晶的体阻衰减。在很长一段时间间隔内测量了每个CdTe单晶的体电阻。将样品放入低温恒温器中。这使我们能够在测量过程中保持温度恒定,并消除光照的影响。测量开始和继续在300k,一段时间后,它急剧上升到390k。我们观察到当温度T = 300 K和T = 390 K时,电阻随时间缓慢下降。所有样品的松弛时间值都很高。所提交的样品必须有四个而不是一个受体或供体水平,其中一些是深层水平。我们发现价带与深受体能级之间或电导率带与深给体能级之间的相互作用导致了这种长松弛时间值。
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