{"title":"New twist to water cleaning guarantees reliability","authors":"J. Ameen","doi":"10.1109/ECTC.1992.204184","DOIUrl":null,"url":null,"abstract":"The author previously showed how different types of testers can be used to monitor wet processes and determine the amount of ionic residues being left on a printed circuit. In the present work, it is shown how this type of technology can be upscaled so that substrates, cards, and boards can be cleaned to levels cleaner than that required of integrated circuits using mostly water. Cleaning circuits beyond the 18.3-M Omega resistivity endpoint of water is easily accomplished producing reliable circuits, which can easily pass insulation resistance testing. The units considered are characterized by relatively low cost, low pollution, and low water usage. These units are particularly desirable where pollution criteria and water usage are severely restricted.<<ETX>>","PeriodicalId":125270,"journal":{"name":"1992 Proceedings 42nd Electronic Components & Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 Proceedings 42nd Electronic Components & Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1992.204184","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The author previously showed how different types of testers can be used to monitor wet processes and determine the amount of ionic residues being left on a printed circuit. In the present work, it is shown how this type of technology can be upscaled so that substrates, cards, and boards can be cleaned to levels cleaner than that required of integrated circuits using mostly water. Cleaning circuits beyond the 18.3-M Omega resistivity endpoint of water is easily accomplished producing reliable circuits, which can easily pass insulation resistance testing. The units considered are characterized by relatively low cost, low pollution, and low water usage. These units are particularly desirable where pollution criteria and water usage are severely restricted.<>
作者先前展示了如何使用不同类型的测试仪来监测湿过程并确定留在印刷电路上的离子残留物的数量。在目前的工作中,它展示了这种类型的技术如何升级,以便基板,卡和板可以清洁到比主要使用水的集成电路更清洁的水平。清洗超过18.3 m ω ω电阻率端点的电路,容易生产出可靠的电路,容易通过绝缘电阻测试。所考虑的装置具有相对低成本、低污染和低用水量的特点。在污染标准和用水受到严格限制的地方,这种装置尤其可取。