{"title":"Delay macromodels for point-to-point MCM interconnections","authors":"A. I. Kayssi, K. Sakallah","doi":"10.1109/MCMC.1992.201452","DOIUrl":null,"url":null,"abstract":"Dimensional analysis is used to develop a macromodel for point-to-point multichip module (MCM) interconnect delay, which applies to lossless and lossy lines. The equation for lossless lines is linear and very simple; the equation for lossy lines is quadratic. In terms of computational costs, the evaluation of delay involves 24 multiplications, and is several orders of magnitude faster than using circuit simulation or transmission line analysis programs to calculate delays. Using the macromodel, the authors derived the dependence of delay on several technology parameters, and calculated the sensitivity of delay to the circuit parameters.<<ETX>>","PeriodicalId":202574,"journal":{"name":"Proceedings 1992 IEEE Multi-Chip Module Conference MCMC-92","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1992 IEEE Multi-Chip Module Conference MCMC-92","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MCMC.1992.201452","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Dimensional analysis is used to develop a macromodel for point-to-point multichip module (MCM) interconnect delay, which applies to lossless and lossy lines. The equation for lossless lines is linear and very simple; the equation for lossy lines is quadratic. In terms of computational costs, the evaluation of delay involves 24 multiplications, and is several orders of magnitude faster than using circuit simulation or transmission line analysis programs to calculate delays. Using the macromodel, the authors derived the dependence of delay on several technology parameters, and calculated the sensitivity of delay to the circuit parameters.<>