Threshold voltage extraction method in field-effect devices with power-law dependence of mobility on carrier density

Abstract

We propose a new method suited for the extraction of the threshold voltage in 2D Field-Effect-Transistors. It can be applied to various classes of devices where the mobility exhibits a power-law dependence on carrier concentration, μ ∝ n_S^α. The result doesn't depend on contact resistance. The method provides a physically sound value: V_G-V_T is proportional to the channel carrier density as checked with V_G-dependent Hall measurements in companion gated Hall devices.