Novel techniques for wideband RF test

Abstract

Wireless communication systems continue to progress to wideband modulation formats. In particular, third generation (3G) wireless and wireless local area networks (WLAN) present extraordinary increases in channel bandwidth. As a result, designers are confronted with a greater divergence between the sinusoidal and modulated stimulus responses of a device. Traditional S-Parameter measurement techniques utilize narrowband, sinusoidal stimulus signals, resulting in the incomplete characterization of active devices. Modulated Vector Network Analysis (MVNA/spl trade/) allows S-Parameter measurements to be performed with complex modulated signals, resulting in truer device characterization. This paper presents a technique allowing the measurement of S-Parameters with complex, modulated signals.