Experiences with implementation of I/sub DDQ/ test for identification and automotive products

Abstract

Quality improvements for CMOS devices by using I/sub DDQ//I/sub SSQ/ tests are a popular topic since early 1990s. This is a report about experiences with the implementation of novel I/sub DDQ/ test methods for Identification & Automotive products at Philips Semiconductors. The aim is to describe the considerations, quality assurance strategy and its realization for Identification & Automotive products like Smart Card Controller ICs for Chip Cards and Radio Frequency Transponders for contactless car immobilization systems considering special security requirements. The main issue of Philips quality strategy is to achieve a better overall quality without sacrificing device costs. In addition to the test aspects some organizational, design, library, Computer Aided Test software, production and other quality & reliability related issues are covered.