Modeling and simulation of package and interconnects

Jerry L. Prince
{"title":"Modeling and simulation of package and interconnects","authors":"Jerry L. Prince","doi":"10.1109/BIPOL.1994.587855","DOIUrl":null,"url":null,"abstract":"This paper discusses electrical design of off chip and on-chip interconnects. Modeling and Simulation CAD tools used for this design are identified and described. The focus of the paper is on off-chip interconnects, which are loosely referred to as packaging structures. These may be single-chip package interconnects, or connections between chips in a multiple-chip system, and include chip electrical connections (bondwires, C4, etc.) and package or connector pins/bumps. Phenomena which are critical to error-free product performance are discussed, and alternative methods of modeling and simulating these phenomena are presented. Similarities and differences of on-chip and off-chip interconnect characteristics are noted when appropriate.","PeriodicalId":373721,"journal":{"name":"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1994.587855","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper discusses electrical design of off chip and on-chip interconnects. Modeling and Simulation CAD tools used for this design are identified and described. The focus of the paper is on off-chip interconnects, which are loosely referred to as packaging structures. These may be single-chip package interconnects, or connections between chips in a multiple-chip system, and include chip electrical connections (bondwires, C4, etc.) and package or connector pins/bumps. Phenomena which are critical to error-free product performance are discussed, and alternative methods of modeling and simulating these phenomena are presented. Similarities and differences of on-chip and off-chip interconnect characteristics are noted when appropriate.
封装与互连的建模与仿真
本文讨论了片外和片内互连的电气设计。识别和描述了用于本设计的建模和仿真CAD工具。本文的重点是片外互连,这是松散地称为封装结构。这些可能是单芯片封装互连,或多芯片系统中芯片之间的连接,并包括芯片电气连接(键合线,C4等)和封装或连接器引脚/凸起。讨论了对无差错产品性能至关重要的现象,并提出了建模和模拟这些现象的替代方法。片上和片外互连特性的异同在适当的时候被注意到。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信