{"title":"Modeling and simulation of package and interconnects","authors":"Jerry L. Prince","doi":"10.1109/BIPOL.1994.587855","DOIUrl":null,"url":null,"abstract":"This paper discusses electrical design of off chip and on-chip interconnects. Modeling and Simulation CAD tools used for this design are identified and described. The focus of the paper is on off-chip interconnects, which are loosely referred to as packaging structures. These may be single-chip package interconnects, or connections between chips in a multiple-chip system, and include chip electrical connections (bondwires, C4, etc.) and package or connector pins/bumps. Phenomena which are critical to error-free product performance are discussed, and alternative methods of modeling and simulating these phenomena are presented. Similarities and differences of on-chip and off-chip interconnect characteristics are noted when appropriate.","PeriodicalId":373721,"journal":{"name":"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1994.587855","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper discusses electrical design of off chip and on-chip interconnects. Modeling and Simulation CAD tools used for this design are identified and described. The focus of the paper is on off-chip interconnects, which are loosely referred to as packaging structures. These may be single-chip package interconnects, or connections between chips in a multiple-chip system, and include chip electrical connections (bondwires, C4, etc.) and package or connector pins/bumps. Phenomena which are critical to error-free product performance are discussed, and alternative methods of modeling and simulating these phenomena are presented. Similarities and differences of on-chip and off-chip interconnect characteristics are noted when appropriate.