R. Sinclair, F. Ponce, T. Yamashita, David J. Smith
{"title":"High resolution electron microscopy of II–VI compound semiconductors","authors":"R. Sinclair, F. Ponce, T. Yamashita, David J. Smith","doi":"10.1201/9781003069614-16","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":103093,"journal":{"name":"Microscopy of Semiconducting Materials, 1983","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microscopy of Semiconducting Materials, 1983","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781003069614-16","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}