Design, Fabrication and Measurement of Micro-Bumps Array for RF Application

Yuchi Yang, J. Chen, Wei Wang, Mengcheng Wang, Shengli Ma, Liu-lin Hu, Shuwei He
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Abstract

In recent years, radio frequency (RF) systems have been moving towards miniaturization. Traditional wire-bonding technology used in RF systems have significant disadvantages in terms of parametric inductance and package size scaling-down. Therefore, people pay more attention to the high-performance and small-size interconnection schemes of RF systems. In this regard, we designed a series of micro bumps arrays for RF application, including arrays with diameters of 15 μm / 30 μm / 40 μm and a pitch of 30 μm / 60 μm / 80 μm. To study RF property of micro bumps array, Cu / Sn micro bumps arrays jointed double-layer coplanar waveguide (CPW) structures were prepared and tested. By subtracting the insertion loss of CPW line from the test structure's insertion loss, the insertion loss of the micro bumps array can be obtained. Comparing the insertion loss of micro bumps arrays with different diameters, the insertion loss of the micro-bumps array with a diameter of 15 μm is the smallest, and the micro bumps with multiple rows have lower insertion loss than a single micro bump. Among them, the insertion loss of a 3 × 6 micro bumps array with a diameter of 15 μm after bonding is 0.15 dB@40GHz.
射频微凸点阵列的设计、制造与测量
近年来,射频(RF)系统正朝着小型化的方向发展。传统的线键合技术在射频系统的参数化电感和封装尺寸缩小方面存在明显的缺点。因此,射频系统的高性能、小尺寸互连方案越来越受到人们的关注。为此,我们设计了一系列用于射频应用的微凸点阵列,包括直径为15 μm / 30 μm / 40 μm,间距为30 μm / 60 μm / 80 μm的阵列。为了研究微凸点阵列的射频特性,制备并测试了Cu / Sn微凸点阵列连接双层共面波导(CPW)结构。用测试结构的插入损耗减去CPW线的插入损耗,即可得到微凸点阵列的插入损耗。对比不同直径微凸点阵列的插入损耗,直径为15 μm的微凸点阵列的插入损耗最小,多排微凸点阵列的插入损耗低于单排微凸点阵列。其中,直径为15 μm的3 × 6微凸点阵列键合后的插入损耗为0.15 dB@40GHz。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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