Can the current behavior of faulty and fault-free ICs and the impact on diagnosis

Abstract

The purpose of this paper is to analyze the current behavior of faulty and fault free integrated circuits (ICs) and its impact on diagnosis. More specifically, we first show that normal sub-threshold current can be modeled by a Gaussian distribution. Then, we investigate faulty IC current variations caused to the load connected to nodes involved in bridging faults. Finally, we propose some modifications to a diagnosis method based on maximum likelihood estimation to deal with these behaviors.