{"title":"A Statistical Digital Equalizer for Loopback-based Linearity Test of Data Converters","authors":"Hongjoong Shin, Jiseon Park, J. Abraham","doi":"10.1109/ATS.2006.18","DOIUrl":null,"url":null,"abstract":"This paper presents a new built-in self test (BIST) method based on efficient digital equalization and spectral prediction techniques. The method enables accurate built-in characterization of the static performance parameters of data converters, and thus test and calibration costs can be significantly alleviated. Based on recent work on dynamic performance parameter characterization using a loopback test, the transfer function of a DAC in loopback mode is estimated with a spectral prediction technique and Chebyshev polynomials. A digital equalizer is designed to compensate for the non-linearity of the DAC in the pre-conversion stage, hence the ADC can be tested with the digitally calibrated analog signals. The digital equalizer overcomes accuracy limitations encountered in a traditional compensation technique, and thus a standard histogram test which may suffer from INL masking problems can be successfully applied. Simulation results are presented to validate the technique","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.18","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
This paper presents a new built-in self test (BIST) method based on efficient digital equalization and spectral prediction techniques. The method enables accurate built-in characterization of the static performance parameters of data converters, and thus test and calibration costs can be significantly alleviated. Based on recent work on dynamic performance parameter characterization using a loopback test, the transfer function of a DAC in loopback mode is estimated with a spectral prediction technique and Chebyshev polynomials. A digital equalizer is designed to compensate for the non-linearity of the DAC in the pre-conversion stage, hence the ADC can be tested with the digitally calibrated analog signals. The digital equalizer overcomes accuracy limitations encountered in a traditional compensation technique, and thus a standard histogram test which may suffer from INL masking problems can be successfully applied. Simulation results are presented to validate the technique