{"title":"Testing 256k word/spl times/16 bit Cache DRAM (CDRAM)","authors":"Y. Konishi, T. Ogawa, M. Kumanoya","doi":"10.1109/TEST.1994.527970","DOIUrl":null,"url":null,"abstract":"Cache DRAM (CDRAM) is a promising high speed memory which can eliminate \"memory bottleneck\" in a computer system and can realize \"unified memory\" for a multi-media system. Test of a CDRAM is broken down to several sub-test steps. Testing a CDRAM comprises separated test and concurrent test of SRAM and DRAM. Dual PGs of ATE are powerful tools both for high speed and concurrent operation tests.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527970","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Cache DRAM (CDRAM) is a promising high speed memory which can eliminate "memory bottleneck" in a computer system and can realize "unified memory" for a multi-media system. Test of a CDRAM is broken down to several sub-test steps. Testing a CDRAM comprises separated test and concurrent test of SRAM and DRAM. Dual PGs of ATE are powerful tools both for high speed and concurrent operation tests.