2D or 3D? benefits of combining both in a single X-ray system

U. E. Frank
{"title":"2D or 3D? benefits of combining both in a single X-ray system","authors":"U. E. Frank","doi":"10.1109/IEMT.2003.1225933","DOIUrl":null,"url":null,"abstract":"Optimum flexibility in X-ray inspection is achieved by combining 2D real-time imaging with 3D Axial Computed Tomography (ACT) in a single system. Switching from one mode to the other takes only a keystroke; and the selection can be made anytime - and as often as required - during the inspection process. The role played by X-ray systems in the inspection of electronic assemblies - especially today's printed circuit boards, densely packed with area array components - is well understood. Unlike machine vision and optical inspection equipment, X-ray systems penetrate materials to expose hidden solder joints on area array devices, such as flip chips and BGAs. Once a need for X-ray inspection equipment has been determined, the next question is \"which is best for the application, two dimensional (2D) or three dimensional (3D)?\".","PeriodicalId":106415,"journal":{"name":"IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003.","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.2003.1225933","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Optimum flexibility in X-ray inspection is achieved by combining 2D real-time imaging with 3D Axial Computed Tomography (ACT) in a single system. Switching from one mode to the other takes only a keystroke; and the selection can be made anytime - and as often as required - during the inspection process. The role played by X-ray systems in the inspection of electronic assemblies - especially today's printed circuit boards, densely packed with area array components - is well understood. Unlike machine vision and optical inspection equipment, X-ray systems penetrate materials to expose hidden solder joints on area array devices, such as flip chips and BGAs. Once a need for X-ray inspection equipment has been determined, the next question is "which is best for the application, two dimensional (2D) or three dimensional (3D)?".
2D还是3D?将两者结合在一个x射线系统中的好处
通过将2D实时成像与3D轴向计算机断层扫描(ACT)结合在一个系统中,实现了x射线检查的最佳灵活性。从一种模式切换到另一种模式只需要一个按键;在检查过程中,可以根据需要随时进行选择。x射线系统在检查电子组件中所起的作用-特别是今天的印刷电路板,密集地挤满了区域阵列组件-是众所周知的。与机器视觉和光学检测设备不同,x射线系统可以穿透材料,暴露区域阵列设备(如倒装芯片和bga)上隐藏的焊点。一旦确定了对x射线检测设备的需求,下一个问题是“二维(2D)或三维(3D)哪个最适合应用?”
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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