Test generation of analog switched-current circuits

Abstract

Based on possible defects on the layout of a practical non-ideal switch, fault model and test generation of current copiers, basic building block of switched-current circuits, are presented in this study. We consider two types of switches, current switches and voltage switches, which have been commonly used in both switched-current circuits and switched-capacitor circuits, and both catastrophic and non-catastrophic faults of transistors used as switches. The generated test sequence achieve full testability of current copiers. The tester and test process are readily applied for any switched-current circuits.