D. Raymond, Dominic F. Haigh, Ray Bodick, Barbara Ryan, Dale McCombs
{"title":"Non-volatile programmable devices and in-circuit test","authors":"D. Raymond, Dominic F. Haigh, Ray Bodick, Barbara Ryan, Dale McCombs","doi":"10.1109/TEST.1994.528029","DOIUrl":null,"url":null,"abstract":"Once various obstacles are overcome, board testers can serve as programming stations for in-circuit-writable devices such as FPGAs, microcontrollers, EEPROMs, and flash memories. Manufacturing cost and cycle time can be considerably reduced.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.528029","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Once various obstacles are overcome, board testers can serve as programming stations for in-circuit-writable devices such as FPGAs, microcontrollers, EEPROMs, and flash memories. Manufacturing cost and cycle time can be considerably reduced.