Experimental results for current-based analog scan

Abstract

This paper presents the design of current-mode circuits for analog scan, which include the highly accurate current-mirror scan latches and the analog shift registers. Experimental data from a test chip fabricated in Orbit 2-micron CMOS Foresight process illustrates that the accuracy of the circuits is sufficient for use in analog on-chip scan-based testing. The interface between analog scan and the P1149.4 test bus is discussed to show system-level applications of this technique.