{"title":"Parallel Field Test Architecture for Boot-ROMs in Safety-Critical SoCs","authors":"Nitesh Mishra, Nikita Naresh, Aravind Acharya","doi":"10.1109/ITCIndia52672.2021.9532633","DOIUrl":null,"url":null,"abstract":"In safety-critical automotive devices with functional Read-only-memories (ROMs), boot-up time and periodic check of correctness of the ROM code is of utmost importance for the overall operation of the device from safety perspective. Current solutions use a hardware/software Cyclic Redundancy Check (CRC) to validate the ROM contents. However, CRC comes with a significant test time overhead, which can impact the boot-up time of device. In this paper, we present a novel non-destructive field-test architecture which validates the ROM contents parallelly and reduces test-time significantly by 99% as compared to native CRC. We also present a novel methodology using which we can perform parallel test on boot-ROMs without disturbing the boot flow during power-up.","PeriodicalId":177825,"journal":{"name":"2021 IEEE International Test Conference India (ITC India)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Test Conference India (ITC India)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITCIndia52672.2021.9532633","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In safety-critical automotive devices with functional Read-only-memories (ROMs), boot-up time and periodic check of correctness of the ROM code is of utmost importance for the overall operation of the device from safety perspective. Current solutions use a hardware/software Cyclic Redundancy Check (CRC) to validate the ROM contents. However, CRC comes with a significant test time overhead, which can impact the boot-up time of device. In this paper, we present a novel non-destructive field-test architecture which validates the ROM contents parallelly and reduces test-time significantly by 99% as compared to native CRC. We also present a novel methodology using which we can perform parallel test on boot-ROMs without disturbing the boot flow during power-up.