Parallel Field Test Architecture for Boot-ROMs in Safety-Critical SoCs

Nitesh Mishra, Nikita Naresh, Aravind Acharya
{"title":"Parallel Field Test Architecture for Boot-ROMs in Safety-Critical SoCs","authors":"Nitesh Mishra, Nikita Naresh, Aravind Acharya","doi":"10.1109/ITCIndia52672.2021.9532633","DOIUrl":null,"url":null,"abstract":"In safety-critical automotive devices with functional Read-only-memories (ROMs), boot-up time and periodic check of correctness of the ROM code is of utmost importance for the overall operation of the device from safety perspective. Current solutions use a hardware/software Cyclic Redundancy Check (CRC) to validate the ROM contents. However, CRC comes with a significant test time overhead, which can impact the boot-up time of device. In this paper, we present a novel non-destructive field-test architecture which validates the ROM contents parallelly and reduces test-time significantly by 99% as compared to native CRC. We also present a novel methodology using which we can perform parallel test on boot-ROMs without disturbing the boot flow during power-up.","PeriodicalId":177825,"journal":{"name":"2021 IEEE International Test Conference India (ITC India)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Test Conference India (ITC India)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITCIndia52672.2021.9532633","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

In safety-critical automotive devices with functional Read-only-memories (ROMs), boot-up time and periodic check of correctness of the ROM code is of utmost importance for the overall operation of the device from safety perspective. Current solutions use a hardware/software Cyclic Redundancy Check (CRC) to validate the ROM contents. However, CRC comes with a significant test time overhead, which can impact the boot-up time of device. In this paper, we present a novel non-destructive field-test architecture which validates the ROM contents parallelly and reduces test-time significantly by 99% as compared to native CRC. We also present a novel methodology using which we can perform parallel test on boot-ROMs without disturbing the boot flow during power-up.
安全关键型soc中引导rom的并行现场测试体系结构
在具有功能性只读存储器(ROM)的安全关键型汽车设备中,从安全角度来看,启动时间和定期检查ROM代码的正确性对设备的整体运行至关重要。当前的解决方案使用硬件/软件循环冗余检查(CRC)来验证ROM内容。然而,CRC带来了大量的测试时间开销,这可能会影响设备的启动时间。在本文中,我们提出了一种新的非破坏性现场测试架构,它可以并行验证ROM内容,并且与本机CRC相比,测试时间显着减少了99%。我们还提出了一种新的方法,使用该方法可以在不干扰启动流程的情况下对引导rom进行并行测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信