Understanding testing for dynamic fault isolation of microprocessors

Abstract

Dynamic Fault Isolation is a very important step in the Failure Analysis process flow of VLSI circuits over the last decade. Key factors in successful dynamic FI include understanding the test methodology, knowledge of the design for test (DFT) features such as BIST and SCAN, and in interpretation of the fault isolation signals. The invited talk will also discuss a few recent advances that help with the challenges of dynamic fault isolation.