Effects of moisture and temperature ageing on reliability of interfacial adhesion with black copper oxide surface

M. Lebbai, O. Lam, Jang‐Kyo Kim
{"title":"Effects of moisture and temperature ageing on reliability of interfacial adhesion with black copper oxide surface","authors":"M. Lebbai, O. Lam, Jang‐Kyo Kim","doi":"10.1109/POLYTR.2002.1020183","DOIUrl":null,"url":null,"abstract":"This paper reports the recent studies on adhesion performance of copper alloy substrate with bare surface, black oxide coating and black oxide with debleeding treatment. The interfacial adhesion of substrate with polyimide tape and glob top resin were measured after autoclave test (or pressure cooker test, PCT), temperature ageing and thermal cycles based on the button shear and tape peel tests. The failure mechanisms were studied from the fracture surface analysis. Moisture absorption and desorption studies at different aging time were carried out to understand the property changes due to moisture. The results show that the black oxide coating improved significantly the interfacial bond strength in the dry condition. The mechanical interlocking mechanism provided by the fibrillar copper oxide was mainly responsible for it. The interfacial bond strengths for all substrates remained almost unchanged after thermal ageing at 150/spl deg/C for 8 h. Thermal cycles between -50/spl deg/C and 150/spl deg/C for 500 and 1000 thermal cycles exhibited generally a negligible influence or decreased slightly the interfacial adhesion. The hygrothermal ageing at 121/spl deg/C/100% RH in an autoclave (i.e. PCT) resulted in large reductions in interfacial bond strength after the initial 48 h ageing and tended to level off with further ageing. Fracture analysis of tape peeled bare copper substrates after 500 cycles of thermal loading revealed a transition of failure mechanism from adhesive to cohesive failure. In contrast, the failure mechanism remained unchanged for oxide-coated substrates. The implications arising from the button shear and tape peel tests are different because of the different fracture modes involved. According to the available data discussed above, the PCT is regarded as the most severe test affecting the adhesion performance. Presence of oxide coating minimized the moisture absorption rate when compared to the bare copper surface.","PeriodicalId":166602,"journal":{"name":"2nd International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics. POLYTRONIC 2002. Conference Proceedings (Cat. No.02EX599)","volume":"388 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2nd International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics. POLYTRONIC 2002. Conference Proceedings (Cat. No.02EX599)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/POLYTR.2002.1020183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

This paper reports the recent studies on adhesion performance of copper alloy substrate with bare surface, black oxide coating and black oxide with debleeding treatment. The interfacial adhesion of substrate with polyimide tape and glob top resin were measured after autoclave test (or pressure cooker test, PCT), temperature ageing and thermal cycles based on the button shear and tape peel tests. The failure mechanisms were studied from the fracture surface analysis. Moisture absorption and desorption studies at different aging time were carried out to understand the property changes due to moisture. The results show that the black oxide coating improved significantly the interfacial bond strength in the dry condition. The mechanical interlocking mechanism provided by the fibrillar copper oxide was mainly responsible for it. The interfacial bond strengths for all substrates remained almost unchanged after thermal ageing at 150/spl deg/C for 8 h. Thermal cycles between -50/spl deg/C and 150/spl deg/C for 500 and 1000 thermal cycles exhibited generally a negligible influence or decreased slightly the interfacial adhesion. The hygrothermal ageing at 121/spl deg/C/100% RH in an autoclave (i.e. PCT) resulted in large reductions in interfacial bond strength after the initial 48 h ageing and tended to level off with further ageing. Fracture analysis of tape peeled bare copper substrates after 500 cycles of thermal loading revealed a transition of failure mechanism from adhesive to cohesive failure. In contrast, the failure mechanism remained unchanged for oxide-coated substrates. The implications arising from the button shear and tape peel tests are different because of the different fracture modes involved. According to the available data discussed above, the PCT is regarded as the most severe test affecting the adhesion performance. Presence of oxide coating minimized the moisture absorption rate when compared to the bare copper surface.
水分和温度老化对黑铜表面界面粘接可靠性的影响
本文报道了铜合金基材裸表面、氧化黑色涂层和氧化黑色脱锈处理的粘附性能的最新研究进展。通过高压灭菌试验(或高压锅试验,PCT)、温度老化和基于按钮剪切和胶带剥离试验的热循环,测量了基材与聚酰亚胺胶带和glob top树脂的界面附着力。从断口分析入手,对其破坏机理进行了研究。通过对不同老化时间的吸湿和解吸进行研究,了解其在不同老化时间下的性能变化。结果表明,在干燥条件下,黑色氧化物涂层显著提高了界面结合强度。纤维氧化铜提供的机械联锁机制是主要原因。在150/spl°C高温老化8小时后,所有衬底的界面结合强度几乎保持不变。在-50/spl°C和150/spl°C之间进行500和1000次热循环,通常对界面结合的影响可以忽略,或略有降低。在高压灭菌器(即PCT)中,在121/spl°/C/100% RH条件下进行湿热时效,导致界面结合强度在初始时效48 h后大幅降低,并随着进一步时效趋于平稳。对带皮裸铜基板500次热载荷后的断裂分析揭示了其从粘结破坏到内聚破坏的转变机制。相比之下,氧化涂层衬底的失效机制保持不变。由于涉及的断裂模式不同,钮扣剪切试验和胶带剥离试验的意义也不同。根据以上讨论的现有数据,PCT被认为是影响粘结性能最严重的试验。与裸露的铜表面相比,氧化涂层的存在使吸湿率降到最低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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