Development of no-flow underfill for lead-free bumped flip-chip assemblies

Zhuqing Zhang, C. Wong
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引用次数: 2

Abstract

The no-flow underfill process in flip-chip assembly is promising for a smaller, faster and more cost-efficient packaging technology. Currently available no-flow underfill materials are mainly designed for eutectic Sn-Pb solders. This paper presents a new no-flow underfill for lead-free solder bumped flip-chip assemblies. Many epoxy resin/HMPA/metal acetylacetonate material systems have been screened in terms of their curing kinetics. Some potential base formulations with curing peak temperatures higher than 200/spl deg/C were selected for further study. The proper fluxing agents were developed and the effects of fluxing agents on the curing kinetics and cured material properties of the potential base formulations were studied by differential scanning calorimetry (DSC), thermo-mechanical analyzer (TMA), dynamic-mechanical analyzer (DMA), thermo-gravimetric analyzer (TGA), and rheometer. The results show that the addition of flux significantly reduced the curing temperature and limits the potential of many formulations for application in lead-free bumped flip chip assemblies. The fluxing capability of several no-flow formulations is evaluated using wetting testing of lead-free solder balls on a copper board. The feasibility of the developed no-flow underfill is demonstrated using a lead-free bumped flip-chip package, which shows 100% interconnection yield after solder reflow.
无铅凸型倒装芯片组件无流底填料的开发
倒装芯片组装中的无流下填充工艺有望实现更小、更快、更经济的封装技术。目前可用的无流底填材料主要用于共晶锡铅焊料。本文提出了一种无铅凸点倒装组件的新型无流底填料。从固化动力学的角度对许多环氧树脂/HMPA/金属乙酰丙酮酯材料体系进行了筛选。选择了一些固化峰温度高于200/spl℃的潜在碱配方进行进一步研究。采用差示扫描量热仪(DSC)、热力学分析仪(TMA)、动态力学分析仪(DMA)、热重分析仪(TGA)和流变仪研究了助熔剂对势基配方固化动力学和固化材料性能的影响。结果表明,助焊剂的加入显著降低了固化温度,限制了许多配方在无铅凸型倒装芯片组件中的应用潜力。通过在铜板上进行无铅焊料球润湿试验,对几种无流配方的助焊剂性能进行了评价。采用无铅凸形倒装芯片封装证明了所开发的无流下填充的可行性,该封装在焊料回流后显示出100%的互连率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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