Single Event Latch-up and Total Ionizing Dose Characterization of a Cobham Designed Smart Power Switch Controller

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325838

M. Von Thun, Younes Lotfi, T. Meade, A. Turnbull

引用次数: 0

Abstract

Single event latch-up and total ionizing dose characterization data is presented for the newly designed and fabricated Cobham radiation-hardened Smart Power Switch Controller.

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Cobham设计的智能电源开关控制器的单事件闭锁和总电离剂量特性

介绍了新设计和制造的Cobham抗辐射智能电源开关控制器的单事件闭锁和总电离剂量表征数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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