A built-in self-test approach for medium to high-resolution digital-to-analog converters

Abstract

A test approach and circuitry suitable for built-in self-test (BIST) of medium to high-resolution digital-to-analog (D/A) converter are described. Offset, gain, linearity and differential linearity errors are tested without using mixed-mode or logic test equipment. The proposed BIST structure presents a compromise between test cost, area overhead and test time. The BIST circuitry has been designed using CMOS 1.2 /spl mu/m technology. The simulations performed show that the BIST is applicable for testing D/A converters up to 16-bits resolution. By a minor modification the test structure would be able to localize the fail situation and to test all D/A converters on the chip.<>