R. Rodrigo, D. Bellmore, J. Diep, T. Jarrett, N. Jonassen, C. Newberg, D. Parkin, D. Pritchard, J. Salisbury, A. Steinman, J. Turangan
{"title":"CPM study: Discharge time and offset voltage, their relationship to plate geometry","authors":"R. Rodrigo, D. Bellmore, J. Diep, T. Jarrett, N. Jonassen, C. Newberg, D. Parkin, D. Pritchard, J. Salisbury, A. Steinman, J. Turangan","doi":"10.1109/EOSESD.2004.5272813","DOIUrl":null,"url":null,"abstract":"Air ionizers are used during the fabrication and assembly of very small components and sub assemblies that are static sensitive. The plate of a standard charged plate monitor (CPM) is relatively large in comparison. Questions have arisen about the relevancy of CPM test results with respect to very small components. The Ionization Committee of the ESD Association performed tests to investigate this relationship.","PeriodicalId":302866,"journal":{"name":"2004 Electrical Overstress/Electrostatic Discharge Symposium","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 Electrical Overstress/Electrostatic Discharge Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2004.5272813","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Air ionizers are used during the fabrication and assembly of very small components and sub assemblies that are static sensitive. The plate of a standard charged plate monitor (CPM) is relatively large in comparison. Questions have arisen about the relevancy of CPM test results with respect to very small components. The Ionization Committee of the ESD Association performed tests to investigate this relationship.