{"title":"Thermal monitoring of memories","authors":"V. Székely, B. Courtois","doi":"10.1109/MTDT.1996.782497","DOIUrl":null,"url":null,"abstract":"3D packaging of memories, downscaling of the memory chips populating these packages, make thermal issues more and more serious. The goal of this paper is to propose means to detect potential problems and to suggest how to include these mechanisms in the general framework of the design of such systems.","PeriodicalId":228146,"journal":{"name":"IEEE International Workshop on Memory Technology, Design and Testing,","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Workshop on Memory Technology, Design and Testing,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.1996.782497","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
3D packaging of memories, downscaling of the memory chips populating these packages, make thermal issues more and more serious. The goal of this paper is to propose means to detect potential problems and to suggest how to include these mechanisms in the general framework of the design of such systems.