Effects of self-heating-induced negative output conductance in SOI circuits

Abstract

Numerous authors have observed that self-heating can lead to negative output conductance in SOI MOSFETs. To date little consideration has been given to the effects of such behavior on circuit operation. This paper presents a first-order analysis of self-heating effects on circuits, and demonstrates through simulation and analysis that self-heating can cause even simple circuits to exhibit complicated nonlinear behavior. Heat-flow analysis shows that thermal resistances in contemporary SOI technologies are large enough that such effects are possible in practical circuits.<>