{"title":"RDL and interposer design for DiRAM4 interfaces","authors":"T. Nigussie, P. Franzon","doi":"10.1109/EPEPS.2016.7835408","DOIUrl":null,"url":null,"abstract":"This paper presents results of signal integrity study conducted on two packaging designs: redistribution layer (RDL) for face-to-face stacking and 2.5D interposer for lateral connection of four processor chips with high performance memory die having a bandwidth of 4Tb/s.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835408","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper presents results of signal integrity study conducted on two packaging designs: redistribution layer (RDL) for face-to-face stacking and 2.5D interposer for lateral connection of four processor chips with high performance memory die having a bandwidth of 4Tb/s.