The effect of spot defects on the parametric yield of long interconnection lines

Abstract

The effect of non-catastrophic (or soft) defects (i.e., neither short nor open) on long interconnection lines is analyzed and an estimate is derived for the frequency-dependent critical area for such lines. The analysis is based on a transmission-line model of interconnection lines, and the reflections caused by the defect are taken into account. This analysis results in an estimated prediction of the parametric yield, and a practical recommendation for a better jog insertion in VLSI routing.