{"title":"Control chart for joint monitoring mean and variance of a stationary process","authors":"Penghui Wang, Zhang Wu","doi":"10.1109/EPTC.2004.1396577","DOIUrl":null,"url":null,"abstract":"As a newly proposed control scheme in SPC, adaptive-loss-function (AL) control chart is a single chart for monitoring process mean and variance simultaneously (Wang and Wu, 2004). It has demonstrated considerable reductions in average run length (ARL) to signal process shifts for independent observations. This article is a follow-up effort to extend the AL chart to a stationary process of AR(1). Under an AR(1) model, the application of the original AL chart is addressed by a residual approach conveniently. Through numerical comparisons, it is found that the AL chart by residual approach is a preferable choice over a wide range of process shifts relative to other two schemes. Generally, the superiority is more evident for moderate to large mean shift in case of positive correlation, and for small to moderate mean shift in presence of negative correlation","PeriodicalId":370907,"journal":{"name":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2004.1396577","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
As a newly proposed control scheme in SPC, adaptive-loss-function (AL) control chart is a single chart for monitoring process mean and variance simultaneously (Wang and Wu, 2004). It has demonstrated considerable reductions in average run length (ARL) to signal process shifts for independent observations. This article is a follow-up effort to extend the AL chart to a stationary process of AR(1). Under an AR(1) model, the application of the original AL chart is addressed by a residual approach conveniently. Through numerical comparisons, it is found that the AL chart by residual approach is a preferable choice over a wide range of process shifts relative to other two schemes. Generally, the superiority is more evident for moderate to large mean shift in case of positive correlation, and for small to moderate mean shift in presence of negative correlation
自适应损失函数(adaptive-loss-function, AL)控制图是SPC中新近提出的一种控制方案,是一种同时监控过程均值和方差的单一图(Wang and Wu, 2004)。它已经证明了相当大的平均运行长度(ARL)的减少,以表明独立观测过程的变化。本文是将AL图扩展到AR的平稳过程的后续努力(1)。在AR(1)模型下,利用残差法方便地解决了原始AL图的应用问题。通过数值比较发现,相对于其他两种方案,残差法的AL图在大范围的过程偏移情况下是一种较好的选择。一般来说,在正相关的情况下,中等到较大的平均位移的优势更为明显,而在负相关的情况下,小到中等的平均位移的优势更为明显