Alternative robust reliability solution for silver finishing

S. Goh, S. Lee, Din-Ghee Neoh, Sia-Wing Kok
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Abstract

In this paper, a silver adhesion promoter process, namely “AgPrep” was introduced for the semiconductor leadframes. The concept of how AgPrep works to improve the adhesion between the silver surface of a leadframe and the epoxy molding compound (EMC) was presented. X-ray Photoelectron Spectroscopy (XPS) analysis was also carried out to study the chemical state of the silver surface after AgPrep's treatment. Besides, the surface energy of AgPrep's treated silver was characterized through the contact angle measurements using a drop shape analyzer. Finally, the adhesion performance of AgPrep process was verified in the button shear tests and a series of reliability tests.
可选的可靠解决方案的银整理
本文介绍了一种用于半导体引线框架的银附着促进剂工艺,即“AgPrep”。介绍了AgPrep如何改善引线框架的银表面与环氧成型化合物(EMC)之间的附着力。利用x射线光电子能谱(XPS)分析AgPrep处理后银表面的化学状态。此外,利用液滴形貌分析仪测量接触角,对AgPrep处理银的表面能进行了表征。最后,通过钮扣剪切试验和一系列可靠性试验验证了AgPrep工艺的粘接性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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